Tecap Automated Test Platform
A platform for test development, system configuration, production, and data analysis.
Tecap organizes the essential components of automated test systems within a shared software environment – from test plans and measurement instruments to variants, production workflows, test results, and analysis.
Instead of creating separate structures for every project, Tecap provides ready-to-use functions and clearly defined interfaces.
From Engineering to Production
- Develop test projects in a structured way
Test plans, product variants, system configurations, and different development stages are managed within a common project model.
- Maintain separate development stages
Test programs can, for example, be created and developed further for prototypes, samples, and released production within a single project.
- Organize multi-stage processes
Workflows connect different test setups and support multi-stage testing and production processes.
- Clearly separate engineering and production
Dedicated applications and permissions are available for development, released production operation, and analysis.
Configure the Test System and Measurement Equipment
The System Architect describes the complete test system, including instruments, resources, wiring, adapters, and the device under test.
- graphical system configuration
- complete representation of system wiring
- automatic signal path detection from the measurement instrument to the DUT/UUT
- integration of measurement, stimulation, and switching instruments through the Tecap Instruments Pack
- scalable multi-site testing
- parallel test execution
This keeps the system configuration as a defined part of the project instead of having to represent it exclusively within the test program.
Production and Traceability
Tecap provides dedicated user interfaces and functions for production operation.
- production releases and role-based operation
- batch, wafer, and tray processing
- mapping and sampling
- serial number and DUT tracking
- management and monitoring of contacting units
- service and maintenance functions
- quality monitoring and production alarms
This allows test execution, product information, and production status to be managed together.
Data, Quality, and Analysis
Test results are logged in a structured form and are already available during test execution.
- data logging to databases and other output formats
- statistics and process capability metrics
- frequency distributions as well as trend and stability analysis
- wafer and tray analysis
- centralized management and analysis of waveforms
- yield monitoring
- pass/fail and monitoring tests
- stop criteria and sampling
Result Analyst enables independent analysis of recorded production data.
Autonomous Stations, Centralized Data
Tecap supports a distributed database architecture.
Test stations can operate largely independently using local databases. Data is synchronized with higher-level systems in the background.
This allows production operation to remain independent even when central infrastructure is temporarily unavailable.
Open for Integration and Customization
Tecap provides plugins and APIs for adapting the platform to existing system and software environments.
Possible extensions include:
- test handling and production workflows
- custom user interfaces and visualizations
- additional data logging
- instrument and system integration
- production and variant information
- dynamic test plan generation
- ERP and MES integration
- customer-specific data processing
The standard platform remains separated from project-specific extensions.
Tecap Features
- Multiple Platform Engines – combination of different software environments, programming environments, and technologies for implementing test programs
- Flexible modular system for project configuration, including sequences and variants, test system setups, data logging, DUT definitions, and more
- Independent development stages within a project for building and extending test programs for different development stages of the device under test, such as prototype, sample, and final production
- Creation and execution of workflows with linked test setups for implementing multi-stage production processes
- Live results and statistics available during test execution in a compact user interface
- Numerical statistics for machine capability analysis according to MSA 1+3, including Cpk, Cgm, and other metrics
- Ready-to-use data logging for test results and statistics, for example to databases, Excel formats, PDF, and more
- Plugin API providing access to test plan content, system setup, and other project information
- Modern graphical user interfaces and user experience
- System Architect – complete definition and configuration of the entire test system, including adapters and DUT/UUT, through graphical user interfaces
- Export of System Reports to Excel, HTML, and other formats
- Configurable and scalable parallel testing (multi-site testing)
- Complete definition of system wiring
- Automatic signal path detection (auto-routing) from the measurement instrument to the DUT/UUT
- Ready-to-use high-level integration of measurement and stimulation instruments as well as switching modules through the Tecap Instruments Pack
- Production Package Management
- Plugin architecture for straightforward customization and integration into your specific system and software environment
- Customization of data logging, test handling, and visualizations for setup and operator use
- Functions for dynamic test plan generation from external sources such as ERP and MES systems
- Service Mode for production environments
- Integrated role-based permission system
- Unit system with automatic conversion of results
- Configurable mains frequency (50 Hz / 60 Hz)
- Waveform Manager – centralized organization of waveforms with database storage
- Quality alarms for improved production monitoring, such as stopping after a defined number of failures or a yield drop
- Condition-dependent tests
- Definition of test relevance for quality assessment, including Pass/Fail and Monitoring
- Wafer Mapping
- Wafer Sampling
- New database design for distributed use across test stations and servers
- Database logging of maintenance activities for each station
- Result Analyst for data analysis, including Cpk/Cgm, frequency distributions, trend and stability analysis, and wafer/tray maps
- Improved Test Plan Editor
- Synchronization of test plan information with comments in .NET code
- Serial Number Tracking
Software Downloads
Tecap
Automated Test Platform
Version 26.2.4
Licensing
Tecap at a Glance
- Platform for developing and operating automated test systems
- Test plans, variants, development stages, and workflows within a shared project model
- Combination of different software and programming environments through Multiple Platform Engines
- Graphical configuration of the complete test system with System Architect
- Automatic signal path detection from the measurement instrument to the DUT
- Integrated measurement and switching equipment through Tecap Instruments
- Multi-site testing and parallel execution
- Retest, repetition, and diagnosis of failed tests
- Production user interfaces and role-based operation
- Batch, wafer, and tray processing, including mapping and sampling
- Management and wear monitoring of contacting units
- Distributed databases with background replication
- Comprehensive data logging and traceability
- Result Analyst for statistics, trends, and production analysis
- Centralized waveform management and analysis
- Quality monitoring and production alarms
- Plugin and API architecture for customer-specific extensions
- Integration with external ERP, MES, and production systems
- Role, permission, and Active Directory integration
- Maintenance and calibration logging
- Continuously improved usability, performance, and stability
System Requirements
Operation System
- Windows 10/11, Windows 8/8.1, Windows 7
- Microsoft® .NET Framework 4.8
Test program and plugin development
- Visual Studio 2017/2019/2022/2026
Database
- Microsoft SQL Server 2016/2014/2012 und Express Edition
- MySQL