Applications in Practice
Tecap is used in a wide range of test, measurement, and production environments. The following examples show how we integrate existing test technology, modernize systems, and bring test processes together with Tecap.
Continue Using Existing Technology
Many test systems contain measurement equipment, adapters, and mechanical components that continue to perform their tasks reliably. Modernization therefore does not necessarily mean replacing the complete system.
We analyze the existing environment and assess which components can continue to be used, which interfaces need to be integrated, and how existing test programs and processes can be transferred to Tecap.
Our experience in developing and implementing complex test systems is an essential part of this. Test software can only integrate a system reliably if the measurement technology, signal paths, DUT interfaces, and processes behind it are also understood.
- continue using and modernizing existing test systems
- migrate existing test programs
- integrate measurement instruments and interfaces from different manufacturers
- connect test processes with production processes
- combine results, traceability, and process data
Automotive
RF, CAN, and High Current in One Test System
For an automotive control unit with keyless-entry functionality, very different test tasks were integrated within a common Tecap environment.
In addition to conventional electrical measurements, these included RF communication with GFSK modulation, input sensitivity and output power, extensive CAN communication, and high-current channels for mirror and window lift motors.
- PXI instrumentation with switching matrix, DMM, Vector Analyzer, and Vector Generator
- integration of a calibrated RF test environment
- CAN bus communication
- high-current measurements and load control
- test programs from initial prototype through to production
RF test chamber with integrated signal and instrument control
Existing Customer Test System Migrated
In this automotive/EMS project, the focus was not on building new test hardware. An existing customer system was to remain in use while its software was modernized.
Existing test programs were migrated from Fortran, and the previously separate solutions were standardized on a common platform.
- continued use of the existing customer test system
- conversion of existing test programs from Fortran
- complete integration of the existing system hardware
- standardization of previously separate solutions
- 56% reduction in test time
- nearly doubled throughput as a result
The project demonstrates how existing test systems can be modernized with Tecap without fundamentally replacing functioning hardware.
Semiconductor and Industrial Applications
Sensor Testing at Wafer Level
In a semiconductor project, sensors were tested directly at wafer level. The particular challenge was the highly precise measurement of resistance bridges and the integration of the wafer prober into the automated process.
To achieve the required measurement accuracy, an additional guard amplifier was developed and automatically switched to the respective measurement points through the switching matrix.
- EG wafer prober
- PXI matrix system
- Keysight 34470A DMM
- auto-routing through Tecap Switching
- process control and prober integration
- data logging and wafer mapping
- integration with the customer database
Tecap thus connected measurement technology, signal routing, system control, and result data within a common test process.
Test system with EG wafer prober
80,000 Signals in Power Plant Control Systems
For the partially automated testing of power plant control systems, around 80,000 signals across more than 200 control cabinets had to be managed.
Standardized measurement building blocks were developed so that different signal types could be described and tested consistently within Tecap.
- analog inputs and outputs
- binary inputs and outputs
- drives and motors
- simulation of high volumes of status messages
- PXI/LXI switching systems
- switching matrix with several thousand signal paths
The project demonstrates that Tecap can also represent very large and heterogeneous signal structures in a systematic way.
Production and Process Integration
Production Testing with a Duplex Adapter
In this project, Tecap handled more than the actual measurements. The software coordinated the complete process between the operator, DUT, adapter, test system, and labeling.
Two adapter drawers could be operated alternately, allowing setup and handling activities to take place in parallel with the running test.
- product selection and identification via 2D code
- automatic control of two adapter drawers
- system release using logged Golden Devices
- Pass/Fail evaluation
- automatic label printing
- verification of correct labeling
- retest detection and traceability
- contact counters for preventive adapter maintenance
This example illustrates that an automated test system does not end with the measurement itself. Production logic, operator workflows, and traceability are equally part of the integration.
Additional Instrument and System Integrations
Not every project requires a completely new test environment. Often, the task is to bring together existing components from different generations and manufacturers within a common software solution.
Examples from completed projects include:
- intelligent batteries and chargers
- PXI systems with Pickering and NI components
- PCI and GPIB measurement instruments
- CANopen communication
- on-board programming
- existing MTQ and customer test systems
- different measurement instruments and signal sources
Tecap is not tied to a specific instrument platform. The key is to integrate the hardware best suited to the testing task reliably into the test sequence and production process.